Webinar: Integrated Probe Card Solutions for Magnetic Testing

We invite you to join us for a webinar on Tuesday, August 25 at 1pm PDT/4pm EDT. We will discuss combining GMW’s expertise in Electromagnets & Magnetic Modeling with Celadon expertise in Probe Cards & Testing for complete integrated solutions compatible with all Probers. The fully integrated probe card is typically used for on-wafer parametric tests, modeling, characterization and wafer level reliability as well as functional tests. REGISTER HERE


Tom King, PhD, Lead Magnet Scientist, GMW Associates

Karen Armendariz, CEO, Celadon Systems

Bill Funk, Chief Technical Officer, Celadon Systems