5207 with Celadon Probe Card

Webinar: Integrated Probe Card Solutions for Magnetic Testing

We invite you to join us for a webinar on Tuesday, August 25 at 1pm PDT/4pm EDT. We will discuss combining GMW’s expertise in Electromagnets & Magnetic Modeling with Celadon expertise in Probe Cards & Testing for complete integrated solutions compatible with all Probers. The fully integrated probe card is typically used for on-wafer parametric tests, modeling, characterization and wafer level reliability as well as functional tests. REGISTER HERE

Speakers:

Tom King, PhD, Lead Magnet Scientist, GMW Associates

Karen Armendariz, CEO, Celadon Systems

Bill Funk, Chief Technical Officer, Celadon Systems